Wrinkle-Based Measurement of Elastic Modulus of Nano-Scale...

Wrinkle-Based Measurement of Elastic Modulus of Nano-Scale Thin Pt Film Deposited on Polymeric Substrate: Verification and Uncertainty Analysis

H-J. Choi, J-H. Kim, H-J. Lee, S-A. Song, H-J. Lee, J-H. Han, M-W. Moon
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Volume:
50
Language:
english
Pages:
7
DOI:
10.1007/s11340-009-9243-8
Date:
June, 2010
File:
PDF, 298 KB
english, 2010
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