![](/img/cover-not-exists.png)
Wrinkle-Based Measurement of Elastic Modulus of Nano-Scale Thin Pt Film Deposited on Polymeric Substrate: Verification and Uncertainty Analysis
H-J. Choi, J-H. Kim, H-J. Lee, S-A. Song, H-J. Lee, J-H. Han, M-W. MoonVolume:
50
Language:
english
Pages:
7
DOI:
10.1007/s11340-009-9243-8
Date:
June, 2010
File:
PDF, 298 KB
english, 2010