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[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Reliability and Risk Assessment of Automated Control Systemâs Typical Circuit Solutions
Kazak, Maksim N., Kruglov, Sergey A., Komarova, Galina V.Year:
2020
DOI:
10.1109/EIConRus49466.2020.9039125
File:
PDF, 540 KB
2020