On Test Data Compression Using Selective Don’t-Care...

Journal of Computer Science and Technology 2005 / 03 Vol. 20; Iss. 2

On Test Data Compression Using Selective Don’t-Care Identification

Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase
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Volume:
20
Pages:
6
DOI:
10.1007/s11390-005-0210-2
Date:
March, 2005
File:
PDF, 669 KB
2005
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