Leakage Current Optimization Techniques During Test Based...

Journal of Computer Science and Technology 2007 / 09 Vol. 22; Iss. 5

Leakage Current Optimization Techniques During Test Based on Don’t Care Bits Assignment

Wei Wang, Yu Hu, Yin-He Han, Xiao-Wei Li, You-Sheng Zhang
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Volume:
22
Language:
galician
Pages:
8
DOI:
10.1007/s11390-007-9091-x
Date:
September, 2007
File:
PDF, 418 KB
galician, 2007
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