Investigation of device-circuit for negative capacitance...

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Semiconductor Science and Technology 2020 / 04

Investigation of device-circuit for negative capacitance vertical nanowire FETs based on SPICE model

huang, weixing, Zhu, Huilong, Jia, Kunpeng, Wu, Zhenhua, Yin, Xiaogen, Huo, Qiang, Zhang, Yongkui
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Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab8e0e
Date:
April, 2020
File:
PDF, 935 KB
2020
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