Impact of AlGaN/GaN Interface and Passivation on the Robustness of Low-Noise Amplifiers
Huang, Tongde, Axelsson, Olle, Bergsten, Johan, Thorsell, Mattias, Rorsman, NiklasYear:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2986806
File:
PDF, 2.03 MB
2020