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Study of Si(100)-SiO 2 Interface Trap Time Constant Distributions in Large Area Conventional MOSFETs-Comparison with Submicron Devices
Bauza, Daniel, Guenifi, NaimaVolume:
97
Journal:
ECS Transactions
DOI:
10.1149/09701.0083ecst
Date:
May, 2020
File:
PDF, 314 KB
2020