Stochastic excitation for high-resolution atomic force...

Beilstein Journal of Nanotechnology 2020 / 05 Vol. 11

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

Cruz Valeriano, Edgar, Gervacio Arciniega, José Juan, Enriquez Flores, Christian Iván, Meraz Dávila, Susana, Moreno Palmerin, Joel, Hernández Landaverde, Martín Adelaido, Chipatecua Godoy, Yuri L
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Volume:
11
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.11.58
Date:
May, 2020
File:
PDF, 4.19 MB
2020
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