Modeling and analysis of radio frequency connector...

International Journal of RF and Microwave Computer-Aided Engineering 2020 / 05

Modeling and analysis of radio frequency connector degradation using time domain reflectometry technique

Li, Qingya, Gao, Jinchun, Flowers, George T., Cheng, Zhongyang, Xie, Gang, Ji, Rui
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Journal:
International Journal of RF and Microwave Computer-Aided Engineering
DOI:
10.1002/mmce.22271
Date:
May, 2020
File:
PDF, 5.83 MB
2020
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