Investigation of the Thermal Loading and Random Vibration...

Investigation of the Thermal Loading and Random Vibration Influences on Fatigue Life of the Solder Joints for a Metal-Oxide-Semiconductor-Field-Effect Transistor in a DC-DC Power Boost Converter

Li, Songgang, Subramaniam, Umashankar, Yang, Guobiao, Ghaderi, Davood, Rajabiyoun, Niloufar
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Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.2985320
File:
PDF, 7.84 MB
2020
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