Strain induced variability study in Gate-All-Around...

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Physica Scripta 2020 / 04

Strain induced variability study in Gate-All-Around vertically-stacked horizontal nanosheet transistors

Mohapatra, E, Dash, Taraprasanna, Jena, J R, Das, Sanghamitra, Maiti, C K
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Journal:
Physica Scripta
DOI:
10.1088/1402-4896/ab89f5
Date:
April, 2020
File:
PDF, 828 KB
2020
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