ToF-SIMS study of selective anchoring of Ru(tpy)...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2020 / 05 Vol. 38; Iss. 3

ToF-SIMS study of selective anchoring of Ru(tpy) 2 complexes on zirconium-phosphate functionalized oxide surfaces

Vitale, Stefania, Laramée-Milette, Baptiste, Valenti, Andrea, Amato, Maria Emanuela, Hanan, Garry S., Tuccitto, Nunzio, Licciardello, Antonino
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Volume:
38
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/6.0000045
Date:
May, 2020
File:
PDF, 2.46 MB
2020
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