Rethinking the Characterization of Nanoscale Field‐Effect...

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Small 2020 / 05

Rethinking the Characterization of Nanoscale Field‐Effect Transistors: A Universal Approach

Byrne, Kristopher, Shik, Alexander, Wisniewski, David, Ruda, Harry E.
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Journal:
Small
DOI:
10.1002/smll.201907321
Date:
May, 2020
File:
PDF, 1.95 MB
2020
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