High-precision atomic force microscopy with atomically-characterized tips
Liebig, Alexander, Peronio, Angelo, Meuer, Daniel, Weymouth, Alfred John, Giessibl, Franz JosephJournal:
New Journal of Physics
DOI:
10.1088/1367-2630/ab8efd
Date:
April, 2020
File:
PDF, 611 KB
2020