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Preparing samples from whole cells using focused-ion-beam milling for cryo-electron tomography
Wagner, Felix R., Watanabe, Reika, Schampers, Ruud, Singh, Digvijay, Persoon, Hans, Schaffer, Miroslava, Fruhstorfer, Peter, Plitzko, Jürgen, Villa, ElizabethJournal:
Nature Protocols
DOI:
10.1038/s41596-020-0320-x
Date:
May, 2020
File:
PDF, 7.85 MB
2020