Error-Vulnerable Pattern-Aware Binary-to-Ternary Data Mapping for Improving Storage Density of 3LC Phase Change Memory
Hong, Jeong Beom, Lee, Young Sik, Kim, Yong Wook, Han, Tae HeeVolume:
9
Journal:
Electronics
DOI:
10.3390/electronics9040626
Date:
April, 2020
File:
PDF, 2.37 MB
2020