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The effects on residual stress in multilayer NTC thermistors during soldering process and bending test (I. soldering process)

Yu, Nam Chol, Ri, Yong Ho, Kim, Chol Man
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Journal:
Microsystem Technologies
DOI:
10.1007/s00542-020-04855-0
Date:
May, 2020
File:
PDF, 1.22 MB
2020
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