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A new approach for determining the thickness of material plate using gamma backscattering method
Chuong, Huynh Dinh, Ngoc Trang, Le Thi, Tam, Hoang Duc, Nguyen, Vo Hoang, Thanh, Tran ThienVolume:
113
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2020.102281
Date:
July, 2020
File:
PDF, 1.47 MB
2020