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Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum
Minkov, D.A., Angelov, G.V., Nestorov, R.N., Marquez, E.Volume:
706
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2020.137984
Date:
July, 2020
File:
PDF, 1.67 MB
2020