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Occurrence of Sharp Hydrogen Effusion Peaks of Hydrogenated Amorphous Silicon Film and Its Connection to Void Structures
Jafari, Sahar, Steffens, Jonathan, Wendt, Michael, Terheiden, Barbara, Meyer, Sylke, Lausch, DominikJournal:
physica status solidi (b)
DOI:
10.1002/pssb.202000097
Date:
May, 2020
File:
PDF, 513 KB
2020