Point defects behavior analysis in thin films and massif...

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Journal of Materials Science: Materials in Electronics 2020 / 5

Point defects behavior analysis in thin films and massif SnO2 by AES spectroscopy and photoluminescence

Ghaffor, Djamel, Lounis, Zakia, Zegadi, Chawki, Mahfoud, Abdelkrim, Derri, Amira, Hadj-Kaddour, Amel, Bouslama, M’hamed
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Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-020-03567-5
Date:
May, 2020
File:
PDF, 1.90 MB
2020
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