Development of CMOS sensors for electron microscopy

Journal of Instrumentation 2019 / 12 Vol. 14; Iss. 12

Development of CMOS sensors for electron microscopy

Mateos, H., Ferretti, A., Mele, L., Perić, I.
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Volume:
14
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/14/12/C12002
Date:
December, 2019
File:
PDF, 2.02 MB
2019
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