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Single event upset induced multi-block error and its mitigation strategy for SRAM-based FPGA
KeFei Xing, JianWei Yang, ChuangSheng Zhang, Wei HeVolume:
54
Language:
english
Pages:
8
DOI:
10.1007/s11431-011-4542-6
Date:
October, 2011
File:
PDF, 894 KB
english, 2011