Research on single event transient pulse quenching effect...

Science China Technological Sciences 2011 / 11 Vol. 54; Iss. 11

Research on single event transient pulse quenching effect in 90 nm CMOS technology

JunRui Qin, ShuMing Chen, BiWei Liu, JianJun Chen, Bin Liang, Zheng Liu
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Volume:
54
Language:
english
Pages:
6
DOI:
10.1007/s11431-011-4579-6
Date:
November, 2011
File:
PDF, 676 KB
english, 2011
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