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Research on single event transient pulse quenching effect in 90 nm CMOS technology
JunRui Qin, ShuMing Chen, BiWei Liu, JianJun Chen, Bin Liang, Zheng LiuVolume:
54
Language:
english
Pages:
6
DOI:
10.1007/s11431-011-4579-6
Date:
November, 2011
File:
PDF, 676 KB
english, 2011