Modeling of Grazing-Incidence X-ray Diffraction from Naphthyl End-Capped Oligothiophenes in Organic Field-Effect Transistors
Winokur, Michael J., Huss-Hansen, Mathias K., Lauritzen, Andreas E., Torkkeli, Mika, Kjelstrup-Hansen, Jakob, Knaapila, MattiJournal:
Crystal Growth & Design
DOI:
10.1021/acs.cgd.0c00281
Date:
May, 2020
File:
PDF, 7.53 MB
2020
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