Nano-characterization of silicon-based multilayers using...

Materials Today Communications 2020 / 12 Vol. 25

Nano-characterization of silicon-based multilayers using the technique of STEM-EELS spectrum-imaging

Anjum, Dalaver H., Qattan, I.A., Patole, Shashikant, Diallo, Elhadj M., Wei, Nini, Heidbreder, Henry
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Volume:
25
Journal:
Materials Today Communications
DOI:
10.1016/j.mtcomm.2020.101209
Date:
December, 2020
File:
PDF, 3.02 MB
2020
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