Depth resolved defect characterization of energetic ion...

Journal of Physics Condensed Matter 2020 / 02 Vol. 32; Iss. 8

Depth resolved defect characterization of energetic ion irradiated ZnO by positron annihilation techniques and photoluminescence

Sarkar, A, Chakrabarti, M, Sanyal, D, Gogurla, N, Kumar, P, Brusa, R S, Hugenschmidt, C
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Volume:
32
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/1361-648X/ab3f74
Date:
February, 2020
File:
PDF, 1.17 MB
2020
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