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[IEEE 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2020.4.22-2020.4.24)] 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Detection Of A Target Track Loss Based On The Shiryaev Rule Using Plots Amplitude Information
Neuimin, Oleksandr S., Zhuk, Serhii Ya., Tovkach, Igor O., Chmelov, Viacheslav O.Year:
2020
DOI:
10.1109/ELNANO50318.2020.9088852
File:
PDF, 298 KB
2020