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[IEEE 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Abu Dhabi, United Arab Emirates (2019.12.9-2019.12.10)] 2019 IEEE International Conference on Imaging Systems and Techniques (IST) - Millimeter Wave Imaging of Surface Defects and Corrosion under Paint using V-band Reflectometer
Rahman, Mohammed Saif ur, Abou-Khousa, Mohamed A.Year:
2019
DOI:
10.1109/ist48021.2019.9010500
File:
PDF, 450 KB
2019