Detecting faults in inner product masking scheme

Journal of Cryptographic Engineering 2020 / 5

Detecting faults in inner product masking scheme

Cheng, Wei, Carlet, Claude, Goli, Kouassi, Danger, Jean-Luc, Guilley, Sylvain
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Journal:
Journal of Cryptographic Engineering
DOI:
10.1007/s13389-020-00227-6
Date:
May, 2020
File:
PDF, 732 KB
2020
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