Quantification of tablet sensitivity to a stress...

Powder Technology 2020 / 06 Vol. 369

Quantification of tablet sensitivity to a stress concentration: Generalization of Hiestand's approach and link with the microstructure

Croquelois, B., Girardot, J., Kopp, J.B., Tchoreloff, P., Mazel, V.
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Volume:
369
Journal:
Powder Technology
DOI:
10.1016/j.powtec.2020.05.002
Date:
June, 2020
File:
PDF, 2.52 MB
2020
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