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[IEEE 2020 7th International Conference on Signal Processing and Integrated Networks (SPIN) - Noida, India (2020.2.27-2020.2.28)] 2020 7th International Conference on Signal Processing and Integrated Networks (SPIN) - Automated Ocular Artifacts Identification and Removal from EEG Data Using Hybrid Machine Learning Methods
Sarin, Mohit, Verma, Akshat, Mehta, Deepthi Hitesh, Kumar Shukla, Praveen, Verma, ShrishYear:
2020
DOI:
10.1109/SPIN48934.2020.9071360
File:
PDF, 569 KB
2020