Simulating the Self-Heating Effect for MOSFETs with Various...

Simulating the Self-Heating Effect for MOSFETs with Various Configurations of Buried Oxide

Petrosyants, K. O., Popov, D. A.
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Volume:
48
Journal:
Russian Microelectronics
DOI:
10.1134/s1063739719070102
Date:
December, 2019
File:
PDF, 420 KB
2019
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