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[IEEE 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2020.4.22-2020.4.24)] 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Porous Silicon Optical Distributed Bragg Reflector Sensor: Methods of Characterization
Ivanov, Ivan, Skryshevsky, ValeriyYear:
2020
DOI:
10.1109/ELNANO50318.2020.9088823
File:
PDF, 458 KB
2020