ChemInform Abstract: REDUCTION OF DEFECTS IN ION IMPLANTED...

ChemInform Abstract: REDUCTION OF DEFECTS IN ION IMPLANTED BIPOLAR TRANSISTORS BY ARGON BACKSIDE DAMAGE

TOPICH, J. A.
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Volume:
12
Journal:
Chemischer Informationsdienst
DOI:
10.1002/chin.198132015
Date:
August, 1981
File:
PDF, 106 KB
1981
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