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Gate-Level Validation of Integrated Circuits With Structured-Illumination Read-Out of Embedded Optical Signatures
Zaraee, Negin, Zhou, Boyou, Vigil, Kyle, Shahjamali, Mohammad M., Joshi, Ajay, Selim Unlu, M.Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.2987088
File:
PDF, 1.89 MB
2020