A Nonintrusive Machine Learning-Based Test Methodology for...

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IEEE Transactions on Microwave Theory and Techniques 2020

A Nonintrusive Machine Learning-Based Test Methodology for Millimeter-Wave Integrated Circuits

Cilici, Florent, Barragan, Manuel J., Lauga-Larroze, Estelle, Bourdel, Sylvain, Leger, Gildas, Vincent, Loic, Mir, Salvador
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Year:
2020
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/TMTT.2020.2991412
File:
PDF, 3.84 MB
2020
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