Investigation of dimensionality in superconducting NbN thin film samples with different thickness and NbTiN meander nanowire samples by measuring the upper critical field
Nazir, Mudassar, Yang, Xiaoyan, Tian, Huanfang, Song, Pengtao, Wang, Zhan, Xiang, Zhongcheng, Guo, Xueyi, Jin, Yirong, You, Lixing, Zheng, DongningJournal:
Chinese Physics B
DOI:
10.1088/1674-1056/ab9740
Date:
May, 2020
File:
PDF, 834 KB
2020