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[IEEE 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2020.4.22-2020.4.24)] 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Application of the computer vision system for evaluation of pathomorphological images
Gargin, Vitaliy, Radutny, Radiy, Titova, Ganna, Bibik, Dmytro, Kirichenko, Aleksey, Bazhenov, OleksiiYear:
2020
DOI:
10.1109/ELNANO50318.2020.9088898
File:
PDF, 2.36 MB
2020