Fully Depleted MAPS in 110-nm CMOS Process With...

IEEE Transactions on Electron Devices 2020 / 6 Vol. 67; Iss. 6

Fully Depleted MAPS in 110-nm CMOS Process With 100–300-μm Active Substrate

Pancheri, Lucio, Giampaolo, Raffaele A., Salvo, Andrea Di, Mattiazzo, Serena, Corradino, Thomas, Giubilato, Piero, Santoro, Romualdo, Caccia, Massimo, Margutti, Giovanni, Olave, Jonhatan E., Rolo, Man
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2985639
Date:
June, 2020
File:
PDF, 1.66 MB
2020
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