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Horizontal diversity in test generation for high fault coverage
ALAMGIR, Arbab, AâAIN, Abu Khari Bin, PARAMAN, Norlina, SHEIKH, Usman Ullah, GROUT, IanVolume:
26
Journal:
TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
DOI:
10.3906/elk-1805-212
Date:
November, 2018
File:
PDF, 295 KB
2018