Oxygen-related Reliability of Amorphous InGaZnO Thin Film...

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IEEE Journal of the Electron Devices Society 2020

Oxygen-related Reliability of Amorphous InGaZnO Thin Film Transistors

Yen, Chia-Chun, Tai, An-Hung, Liu, Yu-Chieh, Chen, Tsang-Long, Chou, Cheng-Hsu, Liu, C. W.
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Year:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2020.2993018
File:
PDF, 1.18 MB
2020
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