In-Situ Transmission Electron Microscopy Observations of...

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ECS Journal of Solid State Science and Technology 2020 / 06

In-Situ Transmission Electron Microscopy Observations of Forward Bias Degradation of Vertical Geometry β-Ga2O3 Rectifiers

Islam, Zahabul, Haque, Aman, Glavin, Nicholas R, Xian, Minghan, Ren, Fan, Polyakov, Alexander Y, Kochkova, Anastasia I, Tadjer, Marko, Pearton, Stephen J.
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Journal:
ECS Journal of Solid State Science and Technology
DOI:
10.1149/2162-8777/ab981d
Date:
June, 2020
File:
PDF, 2.17 MB
2020
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