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Integration, the VLSI Journal 2020 / 5

SRAM on-chip monitoring methodology for high yield and energy efficient memory operation at near threshold voltage

Kim, Taehwan, Jeong, Kwangok, Choi, Jungyun, Kim, Taewhan, Choi, Kyumyung
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Journal:
Integration
DOI:
10.1016/j.vlsi.2020.04.005
Date:
May, 2020
File:
PDF, 3.37 MB
2020
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