Multi-microscopy nanoscale characterization of the doping...

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Nanotechnology 2020 / 06

Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction.

Di Russo, Enrico, Mavel, Amaury, Fan Arcara, Victor, Damilano, Benjamin, Dimkou, Ioanna, Vézian, Stéphane, Grenier, Adeline, Veillerot, Marc, Rochat, Névine, Feuillet, Guy, Bonef, Bastien, Rigutti,
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Journal:
Nanotechnology
DOI:
10.1088/1361-6528/ab996c
Date:
June, 2020
File:
PDF, 1006 KB
2020
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