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[IEEE 2019 IEEE 2nd International Conference on Electronics and Communication Engineering (ICECE) - Xi'an, China (2019.12.9-2019.12.11)] 2019 IEEE 2nd International Conference on Electronics and Communication Engineering (ICECE) - Research on Chip Test Method for Improving Test Quality
Yan, He, Feng, Xi, Hu, Yi, Tang, XiaokeYear:
2019
DOI:
10.1109/ICECE48499.2019.9058553
File:
PDF, 1.24 MB
2019