![](/img/cover-not-exists.png)
[IEEE 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Edinburgh, United Kingdom (2020.5.4-2020.5.18)] 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Influence of series resistance on the experimental extraction of FinFET noise parameters
Tataridou, Angeliki, Ghibaudo, Gerard, Theodorou, ChristoforosYear:
2020
DOI:
10.1109/ICMTS48187.2020.9107908
File:
PDF, 692 KB
2020