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[IEEE 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Edinburgh, United Kingdom (2020.5.4-2020.5.18)] 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - Influence of series resistance on the experimental extraction of FinFET noise parameters

Tataridou, Angeliki, Ghibaudo, Gerard, Theodorou, Christoforos
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Year:
2020
DOI:
10.1109/ICMTS48187.2020.9107908
File:
PDF, 692 KB
2020
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