[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Design and Study of a 65 Kb AntiFuse OTP ROM in a Standard 0.18 um CMOS Process
Ermakov, Igor V., Losevskoy, Alexander Y., Nuykin, Andrey V., Shelepin, Nikolay A., Kravtsov, Alexander S.Year:
2020
DOI:
10.1109/EIConRus49466.2020.9038926
File:
PDF, 1.21 MB
2020