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[IEEE 2020 IEEE 38th VLSI Test Symposium (VTS) - San Diego, CA, USA (2020.4.5-2020.4.8)] 2020 IEEE 38th VLSI Test Symposium (VTS) - Ultra-Wideband Modulation Signal Measurement Using Local Sweep Digitizing Method
Asami, Koji, Kusunoki, Keisuke, Shimizu, Nobuhiro, Aoki, YoshiyukiYear:
2020
DOI:
10.1109/VTS48691.2020.9107610
File:
PDF, 615 KB
2020