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[IEEE 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Kyiv, Ukraine (2020.4.22-2020.4.24)] 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO) - Implementation and analysis of uncertainty of measurement results for lower walls of maxillary and frontal sinuses
Nechyporenko, Alina S., Reshetnik, Viktor M., Alekseeva, Victoriia V., Yurevych, Nadiia O., Nazaryan, Rozana S., Gargin, Vitaliy V.Year:
2020
DOI:
10.1109/elnano50318.2020.9088916
File:
PDF, 367 KB
2020